NXP Semiconductors

Description

Sep 17, 2007 Corrected errata. 2. Changed a tem from MAT to Plane. 3. Chapter 1.4 & 2.3 & 8.0 : Revised the package size from 11x13 to 10x13. 4. Chapter 2.4 : Revised AVD pin description. 5. Chapter 2.8.3 : Eliminated Top boot option. 6. Chapter 2.8.12 & 2.8.16 & 3.8 : Added a. comment about FSA & FCSA. TAP State Machine. The primary purpose of the Test Access Port state machine, which is shown in Figure 3, is to select which of two shift registers, the Instruction Regis- ter or the Data Register, to connect between TDI and TDO. In general, the Instruction Register is used to select which Data Register to scan. The numbers