NXP Semiconductors

Description

DATASHEET Jun 23, 2010 Rev. 4 23 June 2010. 2 of 15. NXP Semiconductors. PESD5V0L7BAS ; PESD5V0L7BS. Low capacitance 7-fold bidirectional ESD protection Reliability Investigation Results, Type: PESD5V0L7BAS . Time period Q4/2012 to Q3/2013. AEC Q101 Test. Conditions. Duration. Quantity. Rejects. # 1. TEST. 4.9 x 3.9 x 1.75. PESD5V0L7BAS . SOT505. (TSSOP8). 3.0 x 3.0 x 1.1. * 8/20 s surge pulse acc. to IEC 61000-4-5. ** acc. to IEC 61000-4-2 (contact discharge). PESD5V0L6UAS. SOT505 (TSSOP8). 3.0 x 3.0 x 1.1. 7. 0.025. 5. 7. 35. 20. PESD5V0L7BS. SOT96 (SO8). 4.9 x 3.9 x 1.75. PESD5V0L7BAS . SOT505 ( TSSOP8). 0.025. 5. 16. 35. 20. PESD5V0L6UAS. SOT505-1 (TSSOP8). 7. 0.025. 5. 7. 35. 20 . PESD5V0L7BS. SOT96-1 (SO8). PESD5V0L7BAS . SOT505-1 (TSSOP8). 16.